Edition

High Resolution Focused Ion Beams: FIB and its Applications

High Resolution Focused Ion Beams: FIB and its Applications

edition of: High Resolution Focused Ion Beams: FIB and its Applications
author: Jon Orloff, Lynwood Swanson, Mark Utlaut
edition language: English
date of publication: 2002

ISBN-13: 978-0-306-47350-0
ISBN-10: 0-306-47350-X
Public
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isbn:9780306473500 - inv:6e59f968a1cd00dbedeb1964de77e378

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