Edition

Defects in microelectronic materials and devices

date of publication:  2009
ISBN-13:  978-1-4200-4377-8
ISBN-10:  1-4200-4377-3
work from which this is an edition:  Defects in microelectronic materials and devices
edition language:  English
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Edition - isbn:9781420043778 - inv:94e91d3dea3d7842bdbf2334945b933a

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