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Surface and Interface Analysis is a peer-reviewed scientific journal published by John Wiley & Sons since 1979. In thirteen issues per year, it publishes original research papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. It is available both online and in print. The current editor in chief is John F. Watts (University of Surrey). Source: Wikipedia (en)
Editions published in Surface and Interface Analysis 200
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Electrodeposition of poly(acrylic acid) on stainless steel with enhanced adhesion properties
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Deposition of polyacrylic acid films on PDMS substrate in dielectric barrier corona discharge at atmospheric pressure
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Surface Analysis: From Single Crystals to Biomaterials
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Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Energies from 50 eV to 30 keV.
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Analysis of ToF-SIMS spectra of poly(2-vinylpyridine) and poly(4-vinylpyridine) with density functional theory calculations
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Investigating Pb diffusion across buried interfaces in Pb(Zr0.2 Ti0.8 )O3 thin films via time-of-flight secondary ion mass spectrometry depth profiling
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Effect of AA2024-T3 surface pretreatment on the physicochemical properties and the anticorrosion performance of poly(γ-glycidoxypropyltrimethoxysilane) sol-gel coating
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ToF-SIMS analysis of a polymer microarray composed of poly(meth)acrylates with C6 derivative pendant groups
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A Technique for Calculation of Shell Thicknesses for Core-Shell-Shell Nanoparticles from XPS Data
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Low Temperature Plasma for the Preparation of Crater Walls for Compositional Depth Profiling of Thin Inorganic Multilayers.
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Rapid multivariate analysis of 3D ToF-SIMS data: graphical processor units (GPUs) and low-discrepancy subsampling for large-scale principal component analysis
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Analysis of hydrogen in materials with and without high hydrogen mobility
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Surface immobilization of functional molecules by reactive self-assembling
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In situcore-level and valence-band photoelectron spectroscopy of reactively sputtered tungsten oxide films
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Preparation of different graphene nanostructures for hydrogen adsorption
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The influence of anti-wear additive ZDDP on doped and undoped diamond-like carbon coatings
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Effect of differently terminal groups of poly(amido-amine) dendrimers on dispersion stability of nano-silica and ab initio calculations
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Molecular dynamics simulation on the interaction between polymer inhibitors and anhydrite surface
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Cleaning of pyrolytic hexagonal boron nitride surfaces
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Nanodomain analysis with cluster-SIMS: application to the characterization of macromolecular brush architecture
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Quasi-simultaneous acquisition of nine secondary ions with seven detectors on NanoSIMS50L: application to biological samples
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Relative ion yields in mammalian cell components using C60 SIMS
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Dual beam organic depth profiling using large argon cluster ion beams.
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Conservation of artists' acrylic emulsion paints: XPS, NEXAFS and ATR-FTIR studies of wet cleaning methods.
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ToF-SIMS imaging of lipids and lipid related compounds in Drosophila brain
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Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry.
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Dye-Enhanced imaging of mammalian cells with SIMS.
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Investigations Into the Interactions of a MALDI Matrix with Organic Thin Films Using C60(+) SIMS Depth Profiling
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Molecular imaging of biological tissue using gas cluster ions
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Brain stem cell division and maintenance studied using multi-isotope imaging mass spectrometry (MIMS).
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Quantitative imaging of inositol distribution in yeast using multi-isotope imaging mass spectrometry (MIMS).
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Detection of immunolabels with multi-isotope imaging mass spectrometry (MIMS).
Subject - wd:Q3505254