Edition

Advances in X-Ray Analysis, Vol. 35

Advances in X-Ray Analysis, Vol. 35

author

Charles S. Barrett

John V. Gilfrich

Ting C. Huang

Ron Jenkins

G. J. McCarthy

Paul K. Predecki

R. Ryon

Deane K. Smith

date of publication:  1992-10-31
ISBN-13:  978-0-306-44249-0
ISBN-10:  0-306-44249-3
work from which this is an edition:  Advances in X-Ray Analysis, Vol. 35
edition language:  English
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Edition - isbn:9780306442490 - inv:efe47cdb60ae4163a3a57676314edb6d

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