Edition

Thin film analysis by X-ray scattering

author

Mario Birkholz

ISBN-13:  978-3-527-31052-4
ISBN-10:  3-527-31052-5
work from which this is an edition:  Thin film analysis by X-ray scattering
edition language:  English
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Edition - isbn:9783527310524 - inv:929e84bd43ba9d1189650d848bdb98e1

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