In-situ X-ray diffraction analysis of the recrystallization process in Cu 2 ZnSnS 4 nanoparticles synthesised by hot-injection
udgivet i: Thin Solid Films
dato for udgivelse: 2015-05
main subject: nanopartikel, røntgendiffraktion
Cites articles 7
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Artikel - wd:Q58559116